SWEA
















    The Solar Wind Ion Analyzer (SWEA) is placed at the end of a 1.3-m boom, which allows a large, clear field of view and minimizes the spacecraft influence on the electrons arriving at the detectors. SWEA utilizes the classic Berkeley top hat hemispherical ESA design with a FOV 360° X 130° field of view.

    Measurement Objectives

    SWEA measures the energy and angular distributions of 2 eV to 6 keV solar wind and magnetosheath ions and ionospheric photoelectrons to:
    • Determine electron impact ionization rates
    • Measure magnetic topology via loss cone measurements
    • Measure primary ionospheric photoelectron spectrum
    • Measure auroral electron populations
    • Evaluate plasma environment

    Useful Mission Documents
    Mission Description
    Spacecraft Description
    Software Interface Specification (SIS) - Description of the instrument and data structures
    Calibration Document - Description of calibration methods

    Archive Bundle Contents
    Documentation - Directory containing the document collection, which includes references to refereed journals using this instrument, and information about calibration and explanation of data structures.

    Raw Data - Directory containing the raw data files

    Calibrated Data - Directory containing the calibrated data files

    Derived Data - Directory containing advanced products


    Selecting and Requesting Data - The following index can be downloaded and edited to contain data that conform to your needs. This allows you to understand the scope of the data set and to tailor your request for specific products.

    As-flown Index - List of actual observations in order of acquisition

    Requesting Data You will need to upload your edited file


    Citing Data Sets for Publications (to be developed)

    Other Useful Products for Interpreting the Data

    References - Publications by team members

    Other Potential Relevant Data - Data that may be relevant from missions other than MAVEN

    SPICE - Archived MAVEN SPICE ancillary data providing observational geometry (positions, orientations, instrument pointing, time conversions, etc.) are available from the PDS NAIF Node.